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Student Number 92246002
Author Chien-Cheng Kuo(郭倩丞)
Author's Email Address adoniss183@yahoo.com.tw
Statistics This thesis had been viewed 1741 times. Download 514 times.
Department Optics and Photonics
Year 2006
Semester 2
Degree Ph.D.
Type of Document Doctoral Dissertation
Language zh-TW.Big5 Chinese
Title Research of the Stresses and Thermal Stabilities in the Dense-Wavelength-Division-Multiplexing (DWDM) Filters
Date of Defense 2007-07-10
Page Count 80
Keyword
  • DWDM
  • stress
  • temperature stability of the center wavelength (
  • Abstract Dense-wavelength-division-multiplexing (DWDM)filter is a very important component for optical fiber communication. DWDM filter fabricated by thin film coating is a type of narrow bandpass filter (NBPF). The stability and reliability of these applications are depended on the mechanical properties of the stresses, the Young’s modulus, Poisson ratio, Temperature coefficient of refractive index and the Coefficients of Thermal Expansion (CTE) of the thin films and their substrates. However if the substrate thicknesses were changed, the mechanical and optical properties of the thin films are also changed. Takashashi is first one to offer the theory model for the temperature stability of the center wavelength (TSCW). But the request for the optic fiber communication system is more difficult, the thickness of the DWDM filters increase. We must consider the effect of the stress changes on the DWDM filters.
    In this paper we provide new formula to analyze the influence of the stresses and thermal stabilities in the Dense-Wavelength-Division-Multiplexing (DWDM) filters and compare the influence of Coefficients of Thermal Expansion (CTE) of the substrate, the Young’s modulus of thin film, Poisson ratio of thin film, Temperature coefficient of refractive index of thin film and the Coefficients of Thermal Expansion (CTE) of the thin films in real 100GHz filter result. We have more understanding to the influence of stress and temperature of the DWDM filters and can apply to the filters of thick thin film thickness or thin substrate. We can predict the change on the optics characteristic that the stress and temperature cause.
    Table of Content 摘要.....................................................................................................................Ⅰ
    目錄....................................................................................................................Ⅳ
    圖目錄.................................................................................................................Ⅵ
    表目錄.................................................................................................................Ⅸ
    第一章 緒論………………………………………………………….………..1
    1-1 研究動機……………...………………………………...……………1
    1-2 研究方法5
    1-3 論文架構………………………………………………..……..……..6
    第二章 基本理論7
    2-1 DWDM濾光片理論及其設計和規格7
    2-1-1 Fabry-Perot之DWDM濾光片原理7
    2-1-2 DWDM濾光片設計10
    2-1-3 DWDM濾光片規格……………………………………….11
    2-2 薄膜應力14
    2-3 薄膜應力文獻回顧………………………………………………..16
    2-4 薄膜中的雙軸應力18
    2-5 多層膜之應力…………….……………………………………….21
    2-6 光學厚度與應力及溫度的關係……………………………….….26
    2-7 理論比較…………………………………………………………..29
    2-7-1 與Takashashi[3]比較………………………………..……..29
    2-7-2 與Kim及Hwangbo[27]比較……………………………….31
    第三章 實驗架構.............................................................................................34
    3-1 溫飄光譜量測系統34
    3-1-1 量測系統架構…………………………….………………34
    3-1-2 光路調整方法……….…………………………………....35
    3-1-3 光學系統要求…………………………………………….38
    3-2 應力量測系統……………………………...……………………..41
    3-2-1 顯微鏡干涉儀(MHT-Ⅲ WYKO)工作原理41
    3-2-2 WYKO系統架構與曲率量測43
    3-3 電子槍蒸鍍系統………..……………………………………...…45
    3-4 DWDM濾光片製造流程……………………………………..…48
    第四章 實驗結果與分析……………………...……………………………50
    4-1 中心波長溫度飄移量與基板熱膨脹係數的關係…………….….50
    4-2中心波長溫度飄移量與薄膜設計的關係…………………………58
    4-3 光學厚度變化與應力的關係………………………...………....…62
    第五章 結論67
    參考文獻69
    Reference [1]J. Minowa and Y. Fujii, “Subnanometer bandwidth interference filter for optical fiber communication systems”, Appl. Opt., 27, pp.1385-1386, 1988.
    [2]H. Takashashi, “Temperature stability of thin-film narrow-bandpass filters produced by ion-assisted deposition”, SPIE Vol. 2253, pp. 1343-1353, 1994.
    [3]H. Takashashi, “Temperature stability of thin-film narrow-bandpass filters produced by ion-assisted deposition”, Appl. Opt., 34, pp. 667-675, 1995.
    [4]A. Zoller, R. Gotzelmann, K. Matl, and D. Cushing, “Temperature-stable bandpass filters deposited with plasma ion-assisted deposition”, Appl. Opt., 35, pp. 5609-5612, 1996.
    [5]A. Zoller, R. Gotzelmann, and K. Matl, “Shift free interference coatings deposited with plasma ion assisted deposition”, presented at the OIC 95, Tucson, Arizona, 1995.
    [6]“Generic Requirements for Fiber Optics Branching Components”, Bellcore GR-1209-CORE, Issue 2, February 1998.
    [7]R. W. Hoffman, in Physics of Thin Films, Vol. 3, Academic Press: New York, p.211, 1966.
    [8]李正中, “薄膜光學與鍍膜技術” ,第五版, 藝軒圖書出版社, p.214-231,(2006).
    [9]朱正煒, “DWDM干涉濾光片之設計及製作”,光學工程第六十八期, 88年12月, P.40-45.
    [10]R. W. Hoffman, in physics of nonmetallic Thin Films, edited by C. H. S.Dupuy and A. Cachard, Plenum Press: New York, p.273, 1976.
    [11]K. L. Chopra, Mechanical effects in thin films, in Thin Film Phenomena, p.266, McGRAW -HILL: New York, 1969.
    [12]G. Gore, “On the Properties of Electro-deposited Antimony”, Trans. Roy.Soc. (London), Part 1, p.185, 1858.
    [13]E. J. Mills, “On Electrostriction”, Proc. Roy. Soc, 26, p.504, 1877.
    [14] G. G. Stoney. “The tension of metallic films deposited by electrolysis”, Proc.Roy. Soc., A82, pp.172-175, 1909.
    [15]K. G. Soderberg and A. K. Graham, “Stress in electro-deposits –Its significance”, Proc. Am. Electroplater’s Soc., 34, p.97, 1947.
    [16]R. H. D. Barklie and H. J. Davies, “The effect of surface conditions and electrodeposited metal on the resistance of materials to repated stress”, Proc. Inst. Mech. Eng.,p.2731,1930.
    [17]C.E. Heussner, A. R. Balden, and L. M. Morse, “Stress Data on Copper Deposits from Alkaline Baths”, Plating ,35, p.719, 1948.
    [18]A. Brenner and S. Senderoff, “Calculation of stress in electrodeposits from the curvature of a plated strip “, J. Research of the Nat’l. Bureau of U. S. Standards, 42 (Research paper RP1954), pp. 105-123, 1949.
    [19]N. N. Davidenkov, “Measurement of residual stress in electrolytic deposits”, Sov. Phys., 2, pp.1595-1598, 1961.
    [20]C. H. Hsueh and A. G. Evans, “Residual Stresses in Metal/Ceramic Bonded Strips”, J. Am. Ceram. Soc., 68, pp.241-248, 1985.
    [21]P. H. Townsend and D. M. Barnett, “Elastic relationships in layered composite media with approximation for the case of thin films on a thick substrate”, J. Appl. Phys. 62, pp.4438-4444, 1987.
    [22]Claude A. Klein, “How accurate are Stoney’s eqution and recent modifications”, J. Appl. Phys. 88, pp. 5487-5489, 2000.
    [23]C. H. Hsueh, “Modeling of elastic deformation of multilayer due to residual stresses and external bending”, J. Appl. Phys. 91, pp.9652-9656, 2002.
    [24]N. H. Zhang and J. J. Xing, “An alternative model for elastic bending deformation of multilayered beams”, J. Appl. Phys. 100, pp. 103519, 2006.
    [25]J. Jiang, J. J. Pan, J. Guo and G. Keiser, “Model for Analyzing Manufacturing-Induced Internal Stresses in 50-GHz DWDM Multilayer Thin-Film Filters and Evaluation of Their Effects on Optical Performances” J. Lightwave. Tech. 23, pp.495-503, 2005.
    [26]C. Wang and Q. Ren, “Influence of stress on the transmission characteristics of multilayer thin films”, Appl. Opt. 45, pp.7858-7862, 2006.
    [27]S. H. Kim and C. K. Hwangbo, “Derivation of the center-wavelength shift of narrow-bandpass filters under temperature change”, Opt. Exp. 12, pp.5634-5639, 2004.
    [28]Steven L. Prins, Alan C. Barron, William C. Herrmann, John R. McNeil, “Effect of stress on performance of dense wavelength division multiplexing filters: optical properties”, Appl. Opt.43, 626-632(2004).
    [29]Vittorio Bertogalli,E.U. Wagemann,EMMERICH Müller,Edgar Leckel, “Testing passive DWDM components:uncertainties in swept-wavelength measurement system”,OFC 2000.
    [30]Paul J. Caber, Stephen J. Martinek, Robert J.Neimann, “A new interferometric profiler for smooth and rough surfaces”, WYKO Corporation 2650 E. Elvira Road Tucson,AZ 857
    Advisor
  • Cheng-Chung Lee(李正中)
  • Files
  • 92246002.pdf
  • approve in 2 years
    Date of Submission 2007-07-23

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