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Student Number 88521084
Author Wei-Juo Wang(¤ý°¶¦{)
Author's Email Address No Public.
Statistics This thesis had been viewed 1591 times. Download 708 times.
Department Electrical Engineering
Year 2000
Semester 2
Degree Master
Type of Document Master's Thesis
Language zh-TW.Big5 Chinese
Title High Precision and Low Cost Voltage Metrology
Date of Defense 2001-06-29
Page Count 60
Keyword
  • comparator
  • DAC test
  • Pin Electronic circuit
  • pricise
  • voltage measurment
  • Abstract In recent years, the demand of mixed signal testing and fast development of system on chip technology are high due to the size of the chip grows larger and larger. However, faster and more complex test equipments are needed to meet the much demanding test specifications. Thus, test the chip precisely and efficiently becomes a difficult and more complicated task.
    In this thesis, we propose a new methodology to measure voltage precisely. The method is able to utilize the comparators in Pin Electronic ICs to exercise the measurement task. The proposed technique simplifies the DAC or LCD Driver IC measurement significantly. Here, we use the probability and statistic methods to analyze the proposed methodology. Experimental results using a demo circuit and a vendor PE card have verify and confirm the feasibility of the proposed methodology.
    Table of Content Chapter 1 Introduction4
    1.1Motivation4
    1.2Thesis Organization3
    Chapter 2 Voltage Measurement Survey and Application Overview4
    2.1Introduction4
    2.1PMU5
    2.2DAC Fault Model and Its Testing6
    2.3DAC testing methods10
    2.4PE card13
    2.5LCD driver14
    2.6IEEE 1149.4 internal test19
    Chapter 3 System Architecture and Test Methodology21
    3.1Introduction21
    3.2System Block Diagram22
    3.3Probability Derivation23
    3.4Confidence Level and Sampling Points27
    3.5Boundary Problem30
    3.6Obtain Voltage Level32
    3.7Summary35
    Chapter 4 Simulation Results and Hardware Implementation36
    4.1Introduction36
    4.2Software simulation and verification36
    4.3Hardware implementation and verification40
    4.4Compare and analyze the data51
    Chapter 5 Conclusion58
    Reference [1]Mark Burns, Gordon W. Roberts ˇ§An introduction to Mixed-Signal IC test and Measurementˇ¨, OXFORD UNIVERSITY PRESS 2001.
    [2]Arabi K, Kaminska B, Rzeszut J. ˇ§BIST for D/A and A/D convertersˇ¨, IEEE Design & Test of Computers, Volume: 13 Issue: 4, winter 1996 Page(s): 40 ˇX49.
    [3]Arabi, K, ˇ§A built-in self-test approach for medium to high-resolution digital-to-analog convertersˇ¨ Test Symposium, 1994, Proceedings of the Third Asian, 1994 Page(s): 373 ˇX378.
    [4]Hassan, I.H.S.; Arabi, K.; Kaminska, B. ˇ§Testing digital to analog converters based on oscillation-test strategy using sigma-delta modulationˇ¨ VLSI in Computers and Processors, 1998. ICCD '98. Proceedings. International Conference on , 1998 , Page(s): 40 ˇX46.
    [5]Donald F, Murrray C, Michael Nash, ˇ§Critical parameters for high-performance dynamic response measurementsˇ¨ International test conference 1990, page(s): 462-471.
    [6]Branson, C.W. ˇ§Integrating tester pin electronicsˇ¨ IEEE Design & Test of Computers, Volume: 7 Issue: 2 , April 1990 Page(s): 4 ˇX14
    [7]Gasbarro, J.A.; Horowitz, M.A. ˇ§Integrated pin electronics for VLSI functional testersˇ¨ Custom Integrated Circuits Conference, 1988, Proceedings of the IEEE 1988 , 1988 Page(s): 16.2/1 -16.2/4
    [8]Itakura, T, ˇ§Effects of the sampling pulse width on the frequency characteristics of a sample-and-hold circuitˇ¨ Circuits, Devices and Systems, IEE Proceedings- Volume: 141 4 , Aug. 1994 , Page(s): 328 ˇX336
    [9]De Rycke, I.; De Baets, J.; Doutreloigne, J.; Van Calster, A.; Vanfleteren, J. ˇ§The realisation and evaluation of poly-CdSe TFT driving circuitsˇ¨ Display Research Conference, 1988., Conference Record of the 1988 International , 1988 Page(s): 70 ˇX73
    [10]Lo, W.M.; Kung, A.; Chan, Y.; Wong, V.W.S. ˇ§LCD Driver Design For Mobile Communications Systemˇ¨ Information Display, 1997, Proceedings of the Fourth Asian Symposium on Page(s): 91 ˇX97
    [11]Valencic, V.; Ballan, H.; Deval, P.; Hochet, B.; Declercq, M. ˇ§50-V LCD driver integrated in standard 5-V CMOS processˇ¨ Custom Integrated Circuits Conference, 1994., Proceedings of the IEEE 1994 , 1994 Page(s): 578 ˇX581
    [12]Byong-Deok Choi; Heuisung Jang; Oh-Kyong Kwon; Hong-Gyu Kim; Myung-Jin Soh, ˇ§Design of poly-Si TFT-LCD panel with integrated driver circuits for an HDTV/XGA projection systemˇ¨ Consumer Electronics, IEEE Transactions on , Volume: 46 Issue: 1 , Feb. 2000 Page(s): 95 ˇX104
    [13]Mahoney, A.W.; Doyle, F.J., III; Ramkrishna, D, ˇ§Inverse problem approach to modeling of particulate systemsˇ¨ American Control Conference, 2000. Proceedings of the 2000, Volume: 3 , 2000 Page(s): 1727 -1731 vol.3
    [14]Shima, T.; Itakura, T.; Yamada, S.; Minamizaki, H.; Ishioka, T, ˇ§Principle and applications of an autocharge-compensated sample and hold circuitˇ¨ Solid-State Circuits, IEEE Journal of , Volume: 30 Issue: 8 , Aug. 1995 Page(s): 906 ˇX912
    [15]Shima, T.; Itakura, T.; Minamizaki, H.; Yagi, T.; Maruyama, T, ˇ§TFT-LCD panel driver IC using dynamic function shuffling techniqueˇ¨ Solid-State Circuits Conference, 1997. Digest of Technical Papers. 43rd ISSCC., 1997 IEEE International , 1997 Page(s): 192 -193, 455
    [16]Watanabe, A.; Maekawa, M.; Hamada, M.; Hirase, J , ˇ¨High precision testing method of mixed signal deviceˇ¨ Instrumentation and Measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10th Anniversary. Advanced Technologies in I & M., 1994 IEEE, 1994 Page(s): 1284 -1288 vol.3
    [17]Chua-Chin Wang, Chi-Feng Wu, Sheng-Hua Chen; Chia-Hsiung Kao ˇ§In-sawing-lane multi-level BIST for known good dies of LCD driversˇ¨ Electronics Letters, Volume: 35 Issue: 18 , 2 Sept. 1999 Page(s): 1543 ˇX1544
    [18]Kac, U.; Novak, F.; Macek, S.; Zarnik, M.S. ˇ§Alternative test methods using IEEE 1149.4ˇ¨ Design, Automation and Test in Europe Conference and Exhibition 2000. Proceedings, 2000 Page(s): 463 ˇX467
    [19]ˇ§IEEE standard for a mixed-signal test busˇ¨ , IEEE Std 1149.4-1999 , 28 March 2000
    Advisor
  • Chauchin Su(Ĭ´Âµ^)
  • Files
  • 88521084.pdf
  • approve in 1 year
    Date of Submission 2001-06-29

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