Title page for 88323110


[Back to Results | New Search]

Student Number 88323110
Author Shin-Fong Xiu(徐盛峰)
Author's Email Address No Public.
Statistics This thesis had been viewed 2296 times. Download 1045 times.
Department Mechanical Engineering
Year 2000
Semester 2
Degree Master
Type of Document Master's Thesis
Language zh-TW.Big5 Chinese
Title 低通濾波器設計可靠度分析
Date of Defense 2001-07-12
Page Count 71
Keyword
  • 可靠度
  • 濾波器分析
  • 累積失效
  • 規格可靠度
  • 類比電路容差分析
  • Abstract none
    Table of Content 第一章 緒論
    1.1 研究動機與背景
    1.2 相關文獻回顧
    1.3 研究範圍
    第二章 可靠度理論與電子系統可靠度
    2.1 可靠度的定義
    2.2 狀態限制函數
    2.3 累積失效模式
    2.4與設計規格有關之初始可靠度
    2.5 電子系統可靠度
    第三章 濾波器簡介與設計
    3.1 濾波器簡介
    3.2 濾波器種類
    3.3 濾波器特性
    3.4 一階與二階濾波器
    3.5 濾波器設計流程
    第四章 低通濾波器設計可靠度分析
    4.1 低通濾波器設計規格失效定義
    4.2 元件變異對低通濾波器頻率響應的影響
    4.3 低通濾波器可靠度設計
    第五章結論與建議
    參考文獻
    Reference [1] M. Slamani, B. Kaminska, “Testing analog circuits by sensitivity computation,” IEEE, [3rd] European Conference, Design Automation, pp.532-537, 1992.
    [2]R.V. White, “Component Tolerance And Circuit Performance: A Case Study,” IEEE, APEC '93, Conference Proceedings 1993., Eighth Annual , 1993 , pp. 922 —927.
    [3]X.T. Ling, R.W. Liu, “Novel Methods for Circuit Worst-Case Tolerance Analysis,” IEEE, Circuits and Systems I: Fundamental Theory and Applications, Vol. 43 4, pp. 272 —278, April 1996.
    [4]W.M. Smith, “Worst Case Circuit Analysis-An Overview (Electronic Parts/Circuits Tolerance Analysis),” IEEE, Reliability and Maintainability Symposium Annual, pp. 326-334, 1996.
    [5]H. McWilliams, “Utilization of Monte Carlo and Worst-case Computer Simulation Methods for Evaluation of Electronic Circuit Designs,” Computer Educ. J., vol. II, no. 3, pp. 17-20, Sept, 1992.
    [6]L.A. Kamas, S.R. Sanders, “Reliability Analysis via Numerical Simulation of Power Electronic Circuits,” IEEE Computers in Power Electronics, 4th Workshop, pp. 175 —179, 1994.
    [7]K.S. Wang, E.H. Wan and W.G. Yang, “A Preliminary investigation of New Mechanical Product Development Based on Reliability Theory,” Reliability Engineering and system Safety, Vol. 40, 1993, pp. 187-194.
    [8]W.J. Kolarik, Creating quality concepts systems strategies and Tools, McGraw Hill, N. Y., 1995.
    [9]K.S. Wang, S.T. chang, Y.C. Shen, “Dynamic Reliability Models for Fatique Crack Growth Problem,” Engineering Fracture Mechanics, Vol.54, No.4, pp.543-556, 1996.
    [10]張豪麟, “系統動態可靠度與其失效率關係的探討,” 國立中央大學機械工程研究所碩士論文, 1999.
    [11]J.D. Wang, T.S. Liu, ”Robot Accuracy Assessment Using Reliability Theory,” Journal of the Chinese Society of Mechanical Engineers,Vol.12,No.2,pp.188-195, 1991.
    [12]石逸群, “累積失效與可靠度關係之探討,” 國立中央大學機械工程研究所碩士論文,2000.
    [13]M. Kaneko, Y. Fujikawa, “Boundary search approach to parameter design for analog circuits,” Circuits and Systems, 1994. APCCAS '94., IEEE Asia-Pacific Conference , 1994.
    [14]R. Spence and R. Soin, “Tolerance Design of Electronic Circuits,” New York: Addison-Wesley, 1988.
    [15]梁伯任, “材料強度退化與累積損傷之探討,” 國立中央大學機械工程研究所碩士論文, 2000.
    [16]W.M. Smith, “Reliability and Maintainability Symposium,” 1996 Proceedings. International Symposium on Product Quality and Integrity, pp. 326 —334, 1996
    [17]E. Lee, T. Wilson, “Methodology for Using Circuit Simulation in the Design and Development of Electronic Power Supplies,” IEEE Power Electronics Specialists Conference, pp.34-45, 1992.
    [18]R. White, “An Introduction to Six Sigma with A Design Example,” IEEE APEC, pp.28-35, 1992.
    [19]Richard Lee, “EMI filter design,” New York, 1996.
    [20]何中庸, “濾波器分析與設計” 全華科技圖書公司, 1999.
    [21]N.B. Hamida, B. Kaminska, “Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling,” IEEE, Test Conference, pp.652-661, 1993.
    [22]J.N. Siddall, “Probabilistic Engineering Design Principle and Applications,” Marcel Dekker, Inc., New York,1983.
    [23]林地財, “通訊濾波器原理與電腦輔助設計,” 全華圖書公司, 1996
    [24]K. Okada, N. Onodera, “Statistical modeling of device characteristics with systematic fluctuation,” IEEE International Symposium, Circuits and Systems , Vol.2, pp.437-440, 2000.
    [25]Finn Jensen, “Electronic Component Reliability,” New York, 1995.
    [26]M.F. Kavanaugh, “Including the effects of component tolerances in the teaching of courses in introductory circuit design,” IEEE Transactions, Education Vol. 38, pp.361-364, 1995.
    Advisor
  • Kuo-Shong Wang(王國雄)
  • Files
  • 88323110.pdf
  • approve immediately
    Date of Submission 2001-07-12

    [Back to Results | New Search]


    Browse | Search All Available ETDs

    If you have dissertation-related questions, please contact with the NCU library extension service section.
    Our service phone is (03)422-7151 Ext. 57407,E-mail is also welcomed.