Title page for 88323017


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Student Number 88323017
Author Jui-Yu Wu(吳俊諭)
Author's Email Address No Public.
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Department Mechanical Engineering
Year 2000
Semester 2
Degree Master
Type of Document Master's Thesis
Language zh-TW.Big5 Chinese
Title none
Date of Defense 2001-07-19
Page Count 115
Keyword
  • 修正型Hughes模式
  • 修正型反冪次模式
  • 溫度循環試驗
  • 溫度範圍
  • 溫變率及循環數
  • 無線電話模組
  • 電容
  • Abstract none
    Table of Content 摘要..........................................................I
    致謝.........................................................II
    總目錄......................................................III
    圖目錄......................................................VII
    表目錄.......................................................XI
    符號說明.....................................................XV
    壹、緒論......................................................1
    1-1 研究動機與目的............................................1
    1-2 文獻回顧..................................................4
    1-2-1國內相關重要文獻.....................................4
    1-2-2國外相關重要文獻.....................................6
    貳、理論說明..................................................9
    2-1 溫度循環試驗..........................................9
    2-1-1溫度循環試驗參數之影響..........................10
    2-2 電容性質.............................................15
    2-2-1電容的簡介......................................16
    2-2-2陶瓷電容器......................................17
    2-2-3鋁電解電容器....................................17
    2-2-4塑膠電容器......................................18
    2-2-5積層電容器......................................19
    2-2-6電容的失效型態..................................20
    2-3 溫度循環試驗對於模組失效的影響.......................20
    2-4 資料的統計分佈型態...................................22
    2-4-1 Weibull分佈函數................................22
    2-4-2 Weibull環境應力-電容值、Weibull 環境應力-電壓值模
    式修正.........................................24
    2-4-3可靠性數據與機率紙..............................26
    2-5 溫度循環效應下的數學模式.............................27
    參、實驗設備與步驟...........................................31
    3-1 試件規格.............................................31
    3-2 儀器設備.............................................31
    3-3 溫度循環試驗之規劃...................................32
    3-4 實驗步驟.............................................34
    3-4-1電容之實驗步驟..................................35
    3-4-2通訊模組之實驗步驟..............................35
    3-4-3本溫度循環試驗應注意事項........................36
    3-5資料處理及分析........................................37
    3-5-1電容的資料處理..................................37
    3-5-2通訊模組的資料處理..............................38
    肆、結果與討論...............................................39
    4-1 溫櫃預設溫度與試件溫度之比較.........................39
    4-2 溫度循環對於電容性能之影響...........................39
    4-3 溫度循環對於電子模組之影響...........................42
    4-3-1模組上各主要接點之功能..........................42
    4-3-2溫度循環中電子模組之功能衰減....................43
    4-4 電容及電子模組退化之數學模式.........................46
    4-4-1電容值-溫度範圍-溫變率-循環數關係式.............46
    4-4-2電壓衰減值-溫度範圍-溫變率-循環數關係式.................48
    伍、結論與未來研究方向.......................................51
    5-1 結論.................................................51
    5-2 未來研究方向.........................................52
    參考文獻.....................................................53
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    Advisor
  • Jiun-ren Hwang(黃俊仁)
  • Files
  • 88323017.pdf
  • approve immediately
    Date of Submission 2001-07-19

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