Title page for 87421023

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Student Number 87421023
Author Tao-Sheng Wang(王道生)
Author's Email Address No Public.
Statistics This thesis had been viewed 1410 times. Download 1076 times.
Department Business Administration
Year 1999
Semester 2
Degree Master
Type of Document Master's Thesis
Language zh-TW.Big5 Chinese
Title 融入極限壽命觀點之平均殘存壽命函數及其在產品品質保證的應用
Date of Defense 2000-07-13
Page Count 50
  • burn-in
  • h(t)
  • hb(t)
  • MRL(t)
  • MRLb(t)
  • MRLL(t)
  • Abstract none
    Table of Content 目錄
    第一章 緒論1
    第一節 問題背景1
    第二節 研究目的3
    第三節 研究流程4
    第二章 傳統平均殘存壽命函數的回顧5
    第一節 平均殘存壽命函數5
    第二節 平均殘存壽命函數與瞬間故障率函數6
    第三節 對數常態分配與BIRNBAUM-SAUNDERS分配的情況9
    第三章 融入極限壽命觀點之平均殘存壽命函數14
    第一節 融入極限壽命觀點之平均殘存壽命函數的定義及其基本性質 14
    第二節 對數常態分配和BIRNBAUM-SAUNDERS分配的結果17
    第四章 平均殘存極限壽命函數26
    第一節 基本構想與定義26
    第二節 平均殘存極限壽命函數的性質27
    第五章 應用修正後平均殘存壽命函數處理產品品質保證的預燒決策34
    第一節 傳統浴缸型瞬間故障率函數的產品預燒決策34
    第二節 瞬間故障率函數為單峰型的預燒決策34
    第三節 融入極限壽命觀點之瞬間故障率函數的預燒決策38
    第四節 範例說明41
    第六章 結論46
    第一節 研究結論46
    第二節 未來的研究方向48
    Reference 中文部分:

    M.C.Bhattacharjee, “Ordering policies for perishable items with unknown shelf life/variable supply distribution,” Indian Institute of Management, Calcutta, Technical Report, 1984.
    M.C.Bhattacharjee, “Ordering policies for perishable items with unknown shelf life/variable supply distribution,” Indian Institute of Management, Calcutta, Technical Report, 1984.
    R.C.Elandt-Johnson,N.L.Johnson, Survival Models and Data Analysis Wiley, New York, 1980.
    A.J.Gross, V.A.Clark, Survival Distributions:Reliability Applications in the Biomedical Sciences, Wiley, New York, 1975.
    D.S.Chang, L.C. Tang, ”Percentile bound and tolerance limits for the Birnbaum-Saunders,” Communication in Statistics-Theory and Methods, Vol 23,No 8, 1994 , pp 2853-2863.
    D.S.Chang, ”Optimal burn-in decision for products with an unimodal failure rate function,” European Journal of Operational Research, 2000, forthcoming.
    D.S. Chang, L.C. Tang, ”Reliability bounds and critical time for the Birbaum-Saunders distribution,” IEEE Trans. Relibaility, Vol 42, No 3, 1993.
    D.S.Chang, ”Critical time of the lognormal distribution ”, Micro- electronic&Reliability, Vol 34, No2, 1994, pp 261-266.
    E.L.Crow,K.Shimizu, Lognormal Distributions:Theory and Application, New York:M.Dekker, 1988.
    G.L.Ghai, J.Mi, ”Mean residual life and its association with failure rate,” IEEE Trans. Relibaility, Vol 48, No 3, 1999.
    K.K.Govil, K.K.Aggarwal, “Mean residual life function for normal, gamma and lognormal densities,” Relibaility Engineering ,Vol 5, 1983, pp 47-51.
    F.Guess, F. Proschan, ”Mean residual life:Theory and applications, “ Handbook of Statistics ( P.R. Krishnaiah, C.R.Rao ,Eds) Vol 7, 1988, pp 215-224.
    N.L.Johnson, Samuel Kotz, Continuous Univariate Distributions, New York : Wiley & Sons, 1994.
    W.Kuo,.Y.Kuo, ”Facing the headaches of early failures:A state-of- the-art review of burn-in decisions,” Proceedings of the IEEE, Vol 71, No 1, 1983, pp 1257-1266.
    J.F.Lawless, Statistical Models and Methods for Lifetime Data, 1982.
    J.Mi, “Bathtub failure rate and upside-down bathtub mean residual life,” IEEE Trans Relibaility, Vol 44, 1995, pp 388-391.
    D.G.Morrison, ”On linearly increasing mean residual lifetimes, ”J. Applied. Probability, Vol 15, 1978, pp 617-620.
    E.J.Muth, “Reliability models with positive memory derived from the mean residual life function,” The Theory and Applications of Reliability, Vol 2, 1977, pp 401-435.
    W.Nelson, Applied Life Data Analysis, New York: Wiley&Sons,Inc, 1982.
    D.G.Nguyen, D.N.P.Murthy, “Optimal burn-in time to cost minimize for products sold under warranty,” IIE Transactions, 14, 3 , 1982, pp 167-174.
    H.Schneider, Truncated and Censored Samples from Normal Popu- lations, New York:Marcel Dekker, 1986.
    L.C.Tang, Y.Lu, E.P.Chew, ”Mean residual life of lifetime distri- butions, ” IEEE Trans. Relibaility, Vol 48, No 1, 1999.
  • Dong-Shang Chang(張東生)
  • Files
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  • approve immediately
    Date of Submission 2000-07-13

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