Title page for 87324014


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Student Number 87324014
Author Lian-She Tsai(蔡良盛)
Author's Email Address No Public.
Statistics This thesis had been viewed 1708 times. Download 727 times.
Department Electrical Engineering
Year 1999
Semester 2
Degree Master
Type of Document Master's Thesis
Language zh-TW.Big5 Chinese
Title IEEE 1057 Based ADC Test Methodology
Date of Defense 2000-06-30
Page Count 51
Keyword
  • analog to digital
  • analog to digital test methodology
  • Mix signal testing
  • Abstract 近年來由於混合信號的量測的需求據增,再加上單晶系統(system on chip:SOC)技術快速發展,使得晶片的容量變大,因而使得測試相對變的較複雜,所需測試時間亦較長,因此我們便根據IEEE 1057的標準,提出各種不同的量測方法,使傳統的大型混合信號測試機台,可以有一個很好的量測技術方法可參考。
    為了使量測不因取樣的關係,產生不應該有的錯誤,因此我們先提出取樣點的頻率與週期的決選方法,為了使IEEE 1057(IEEE Standard for Digitizing Waveform Recorders)的各種量測方法,能夠看出對類比數位轉換器(analog to digital converter:ADC)的明顯差異,因此我們提出了非理想類比數位轉換器的錯誤模型,接著利用建立起來的非理想類比數位轉換器模型,使用IEEE 1057各種不同方法,針對我們數位類比轉換器量測比較其非理想特性,與雜訊對我們實際量測的差異,最後為了方便使用者能夠很方便的更改類比數位轉換器的各種規格,進行觀察各種測試方法所得到的不同結果,因此我們以MATLAB建立起一個使用者介面,使我們能夠很輕易更改不同的類比數位轉換器規格,並迅速的顯示各種不同的量測結果。
    Table of Content 第一章 簡介 1
    1.1動機..............................................1
    1.2研究方法.......................................... 1
    1.3其他章節架構......................................4
    第二章 取樣的基礎面 5
    2.1取樣信號與取樣個數的關係..........................5
    2.2頻率的選擇對我們信號分析的影響....................8
    2.3由弦波峰值的量測來決定如何取樣....................10
    第三章 類比數位轉換器非理想特性的探討 15
    3.1類比數位轉換器增益與偏差量.........................15
    3.2類比數位轉換器非線性特性的考量.....................18
    3.3類比數位轉換器操作頻率特性的考量...................20
    第四章 類比數位轉換器使用IEEE 1057 標準量測 22
    4.1柱狀圖測試法.......................................22
    4.2曲線符合度法.......................................26
    4.3傅利葉分析法.......................................31
    4.4單調與磁滯現象的量測...............................36
    4.5時間基礎錯誤分析法.................................37
    4.6步級嚮應分析.......................................40
    第五章 MATLAB設計使用者介面 42
    5.1MATLAB使用介面設計流程.............................42
    5.2MATLAB各功能鍵設計簡單介紹.........................43
    5.3 MATLAB控制測試視窗介紹............................45
    第六章 結論 49
    參考文獻 50
    Reference [1] Chin-Long Wey ,“Mixed-signal circuit testing-A review”, Proceedings of the Third IEEE International Conference,Vol.2,pp. 1064 —1067, 1996
    [2] Diamant, P.E.; Harrold, S.J.,”Automatic generation of mixed-signal test programs from simulation data”, Testing Mixed Signal Circuits, IEE Colloquium, Vol.6,pp1-4,1992
    [1] Demidenkol, S.; Piuri, V.,” Using spectral warping for instrumentation and measurements in mixed-signal testing”, Instrumentation and Measurement Technology Conference, 1999. IMTC/99. Proceedings of the 16th IEEE, Vol.3,pp1547-1552,1999
    [4] Mir, S.; Lubaszewski, M.; Liberali, V.; Courtois, B.,” Built-in self-test approaches for analogue and mixed-signal integrated circuits”, Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium,Vol.2,pp1145 —1150,1996
    [5] Hansen, P.,” Implementing boundary scan test strategies”, AUTOTESTCON '90. IEEE Systems Readiness Technology Conference. 'Advancing Mission Accomplishment', Conference Record.,pp325 —329,1990
    [6] Russell, G.,“Knowledge based systems used in design for testability-an an overview”, Algorithmic and Knowledge Based CAD for VLSI, IEE Colloquium,Vol.1,pp1-4,1989
    [1] 傅偉宸,”Frequency Response Measurement Using on-Chip ADC”,中央大學,Vol3,pp11-17,1998
    [8] IEEE Std 1057 , IEEE trial-use standard for digitizing waveform recorders, 21 July,1989
    [9] IEEE Std 1057-1994 , IEEE standard for digitizing waveform recorders, 30 Dec. 1994
    [10] ANSI/IEEE Std 181-1977, IEEE standard on pulse measurement and analysis by objective techniques, 22 July 1977
    [11] MATLAB High-performance numeric computation and visualization software : Building a graphical user interface, The MATH WORKs Inc,1995
    [12] Kevin M. Daugherty, Analog-to-Digital Converter A Practical Approach,1994
    [13] Ehsanian, M.; Kaminska, B.; Arabi, K.,” A new digital test approach for analog-to-digital converter testing”, VLSI Test Symposium, 1996., Proceedings of 14th ,pp60-65,1996
    [14] Kuyel, T.,“Linearity testing issues of analog to digital converters”, Test Conference, 1999. Proceedings. International,pp747-756,1999
    [15] Larrabee, J.H.; Hummels, D.M.; Irons, F.H.,” ADC compensation using a sinewave histogram method”, Instrumentation and Measurement Technology Conference, 1997. IMTC/97. Proceedings. Sensing, Processing, Networking.,Vol.1,pp628-631,1997
    [16] Mielke, J.A. ,“Frequency domain testing of ADCs”, IEEE Design & Test of Computers,Vol.13,pp64-69,1996
    Advisor
  • Chauchin Su(蘇朝琴)
  • Files
  • 87324014.pdf
  • approve immediately
    Date of Submission 2000-06-30

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